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DataRay Inc. Releases BladeCam2 USB 3.0 CMOS Beam Profiler

Press Releases |April 2, 2021

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of the new BladeCam2 series of USB 3.0 CMOS beam profiling cameras.

DataRay Inc. Awarded ISO 9001:2015 Certification

Press Releases |April 8, 2019

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce it has achieved ISO 9001:2015 certification. ISO 9001 is the international standard related to quality management systems (QMS).

DataRay Inc. Announces TaperCamD-LCM Large Area CMOS Beam Profiler

Press Releases |January 28, 2019

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of the new TaperCamD-LCM large area CMOS beam profiler.

DataRay Inc. Announces WinCamD-IR-BB Broadband 2 to 16 µm MWIR/FIR Beam Profiler System

Press Releases |August 4, 2017

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, broadband 2 to 16 µm MWIR/FIR beam profiler system: the WinCamD-IR-BB.

DataRay Inc. Announces WinCamD-LCM-NE NIR-Enhanced CMOS Beam Profiler

Press Releases |April 1, 2016

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, NIR-Enhanced version of the popular WinCamD-LCM CMOS beam profiler.

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