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DataRay Inc. Releases BladeCam2 USB 3.0 CMOS Beam Profiler

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DataRay Inc. Announces TaperCamD-LCM Large Area CMOS Beam Profiler

Press Releases | January 28, 2019

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of the new TaperCamD-LCM large area CMOS beam profiler.

DataRay Inc. Announces WinCamD-IR-BB Broadband 2 to 16 µm MWIR/FIR Beam Profiler System

Press Releases | August 4, 2017

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, broadband 2 to 16 µm MWIR/FIR beam profiler system: the WinCamD-IR-BB.

DataRay Inc. Announces WinCamD-LCM-NE NIR-Enhanced CMOS Beam Profiler

Press Releases | April 1, 2016

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, NIR-Enhanced version of the popular WinCamD-LCM CMOS beam profiler.

DataRay Inc. Announces WinCamD-QD Quantum Dot SWIR/eSWIR Beam Profiler

Press Releases | April 7, 2021

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of its new SWIR/eSWIR beam profiling camera, the WinCamD-QD series.

DataRay Inc. Awarded ISO 9001:2015 Certification

Press Releases | April 8, 2019

DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce it has achieved ISO 9001:2015 certification. ISO 9001 is the international standard related to quality management systems (QMS).

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