Viewing Beam Profiling Concepts
Systematic Error in ISO 11146 Measurements
Beam Profiling Concepts |May 12, 2016
Systematic error is an important calculation in any measurement system, and especially in ISO 11146 laser beam profiling measurements. In this blog post, we address the systematic error inherent to the measurement of beam width as laid out in the ISO 11146 standard.
Small Beam Width Theoretical and Experimental Error
Beam Profiling Concepts |March 14, 2016
One of the most important measurements in laser beam profiling is the beam width measurement. A common question we see is “How small of a beam can I measure with this camera?”
Flat-Top Beams and Plateau Uniformity Calculations
Beam Profiling Concepts |February 26, 2016
A flat-top beam (otherwise known as a top-hat) is used in various applications where a controlled profile is desired (i.e. a uniform density across the irradiated surface). Passing a Gaussian beam through special optics will create the flat-top beam and is the most common way of generating a flat-top beam. Uniform excimer beams are used in many material processing applications (e.g. creating integrated circuits). Industries such as welding, drilling, and medicine also make extensive use of flat-top beams.
Beam Profiling for Small Beam Widths or Spot Size
Beam Profiling Concepts |September 14, 2015
Beam width or spot size is an important parameter to identify in selecting the optimal beam profiler. Scanning slit beam profilers are ideal for measuring small Gaussian beams.
Profiling Large Laser Beams: Considerations and Solutions
Beam Profiling Concepts |August 18, 2015
Profiling large laser beams is a common industry need, one with many challenges. What is small to one researcher may be quite large to another...