Viewing Press Releases
DataRay Inc. Awarded ISO 9001:2015 Certification
Press Releases |April 8, 2019
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce it has achieved ISO 9001:2015 certification. ISO 9001 is the international standard related to quality management systems (QMS).
DataRay Inc. Announces TaperCamD-LCM Large Area CMOS Beam Profiler
Press Releases |January 28, 2019
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of the new TaperCamD-LCM large area CMOS beam profiler.
DataRay Inc. Announces WinCamD-IR-BB Broadband 2 to 16 µm MWIR/FIR Beam Profiler System
Press Releases |August 4, 2017
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, broadband 2 to 16 µm MWIR/FIR beam profiler system: the WinCamD-IR-BB.
DataRay Inc. Announces WinCamD-LCM-NE NIR-Enhanced CMOS Beam Profiler
Press Releases |April 1, 2016
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, NIR-Enhanced version of the popular WinCamD-LCM CMOS beam profiler.