We are excited to announce the launch of our updated website!

If you previously had a user account registered, you will need to set a new password...

Come visit DataRay Inc. at SPIE BiOS (booth 8410) and SPIE Photonics West (booth 1840) in San Francisco. Stop by to see what's new, get a demonstration of our newest

Our customers often ask us what type of beam profiler they should use to measure their laser beam(s). In this blog post, we explain the relative advantages and disadvantages of a scanning slit profiler and a camera-based profiler.

In this post, we discuss our major new software update, as well as provide a preview of the demos we'll be showing at CLEO Conference 2016

DataRay will be attending both SPIE BiOS 2016 (booth 8842) and SPIE Photonics West 2016 (booth 2239) in San Francisco.

We will have several product demonstrations set up – read on to learn more!

Visit us at SPIE DSS 2014, May 6 to 8, at booth 2056...