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Major Software Update & CLEO Conference 2016
DataRay Software |May 26, 2016
In this post, we discuss our major new software update, as well as provide a preview of the demos we'll be showing at CLEO Conference 2016
Systematic Error in ISO 11146 Measurements
Beam Profiling Concepts |May 12, 2016
Systematic error is an important calculation in any measurement system, and especially in ISO 11146 laser beam profiling measurements. In this blog post, we address the systematic error inherent to the measurement of beam width as laid out in the ISO 11146 standard.
M² and High-order Modes
M Squared |April 27, 2016
M² is a measurement that was originally designed to determine the quality of a real beam in comparison to a theoretically perfect fundamental mode Gaussian beam (Siegman 1990). Although many lasers are designed to output a fundamental mode Gaussian beam, imperfections and/or cavity design in the laser will often cause superimposed higher-order transverse modes.
M² Measurement
M Squared |April 12, 2016
As leaders in the laser beam profiling business, we have worked with M² for decades. In this blog post we discuss M², when to use it, and the way it is measured.
DataRay Inc. Announces WinCamD-LCM-NE NIR-Enhanced CMOS Beam Profiler
Press Releases |April 1, 2016
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, NIR-Enhanced version of the popular WinCamD-LCM CMOS beam profiler.
CMOS vs. CCD Sensors
Beam Profiling Cameras |March 29, 2016
CMOS and CCD image sensor technology was developed in the 1960s. Although for the last forty years CCD sensors have dominated the market, improvements in CMOS sensor design have catapulted them to a growing market share and the CMOS seems poised to replace the CCD in many applications.