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Come see us at SPIE Optics + Photonics 2019!
Events |August 12, 2019
Come visit DataRay Inc. at SPIE Optics + Photonics at booth 102.
Updated website
General |July 30, 2019
We are excited to announce the launch of our updated website at www.dataray.com!
DataRay Inc. Awarded ISO 9001:2015 Certification
Press Releases |April 8, 2019
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce it has achieved ISO 9001:2015 certification. ISO 9001 is the international standard related to quality management systems (QMS).
DataRay Inc. Announces TaperCamD-LCM Large Area CMOS Beam Profiler
Press Releases |January 28, 2019
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of the new TaperCamD-LCM large area CMOS beam profiler.
DataRay Inc. Announces WinCamD-IR-BB Broadband 2 to 16 µm MWIR/FIR Beam Profiler System
Press Releases |August 4, 2017
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, broadband 2 to 16 µm MWIR/FIR beam profiler system: the WinCamD-IR-BB.
Come see us at SPIE BiOS and Photonics West 2017!
Events |January 25, 2017
Come visit DataRay Inc. at SPIE BiOS (booth 8410) and SPIE Photonics West (booth 1840) in San Francisco.