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Updated website
General |July 30, 2019
We are excited to announce the launch of our updated website at www.dataray.com!
DataRay Inc. Awarded ISO 9001:2015 Certification
Press Releases |April 8, 2019
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce it has achieved ISO 9001:2015 certification. ISO 9001 is the international standard related to quality management systems (QMS).
DataRay Inc. Announces TaperCamD-LCM Large Area CMOS Beam Profiler
Press Releases |January 28, 2019
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of the new TaperCamD-LCM large area CMOS beam profiler.
DataRay Inc. Announces WinCamD-IR-BB Broadband 2 to 16 µm MWIR/FIR Beam Profiler System
Press Releases |August 4, 2017
DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, broadband 2 to 16 µm MWIR/FIR beam profiler system: the WinCamD-IR-BB.
Come see us at SPIE BiOS and Photonics West 2017!
Events |January 25, 2017
Come visit DataRay Inc. at SPIE BiOS (booth 8410) and SPIE Photonics West (booth 1840) in San Francisco.
Pulsed Lasers: Pulse Energy & Imager Gain
Pulsed Lasers |January 10, 2017
This is the third entry in a series of blog posts that explore DataRay’s pulsed laser measurement capabilities. This blog post will talk about the energy requirements involved with measuring pulsed lasers, and how the received signal can be controlled when the exposure time is fixed.