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Line Laser Profiling System
Specialized Beam Profiling Systems |November 3, 2016
DataRay has always been committed to providing accurate and reliable solutions for characterizing a wide range of laser beams. We take pride in listening to customer requests and working to expand our product line to meet their needs. DataRay is happy to announce our new Line Laser Profiling System (LLPS) with the capability to provide direct measurements of line lasers up to 200 mm in length and down to 55 microns in thickness.
DataRay CMOS Cameras and UV Light
UV |October 10, 2016
Although in the past DataRay CMOS beam profiling cameras were listed with a wavelength range of 355-1350 nm due to assumed sensor deterioration by short wavelength light, recent testing has demonstrated the CMOS sensor can image ultraviolet (UV) light down to 266 nm without sensor degradation; in this blog post we describe the test results.
When to Use the D86 Beam Width Measurement Method
Beam Profiling Concepts |September 15, 2016
Although the clip level method and the second moment method are the most popular methods of beam width measurement, other beam width measurement techniques such as the D86 method can be used with beam profiling cameras.
Tutorial: Interfacing to C++ in Visual Studio 2013
Interfacing |August 31, 2016
It is our pleasure to announce a new Visual C++ tutorial for interfacing DataRay Camera and Slit Scan Profilers using the DataRay OCX.
Scanning Slits vs. Cameras
Beam Profiling Concepts |August 4, 2016
Our customers often ask us what type of beam profiler they should use to measure their laser beam(s). In this blog post, we explain the relative advantages and disadvantages of a scanning slit profiler and a camera-based profiler.
Why We Tilt Our Filters
Beam Profiling Cameras |July 21, 2016
In this blog post, we explain why tilting our filters is necessary for an accurate beam measurement.