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Come see us at SPIE BiOS and Photonics West 2016!
Events |February 12, 2016
DataRay will be attending both SPIE BiOS 2016 (booth 8842) and SPIE Photonics West 2016 (booth 2239) in San Francisco.
Image Degradation Diagnosis and Filter/Sensor Cleaning
Application Notes |January 21, 2016
Although DataRay does not recommend cleaning beam profiling camera sensors due to the delicacy of the parts, cleaning may become necessary if dirt is interfering with the quality of laser beam profiling measurements. If the user decides to clean the sensor, we recommend extreme caution as user-damaged sensors are not covered by the camera’s three-year warranty.
Tutorial: WinCamD and BeamMap2 Interface to Labview
Interfacing |January 6, 2016
We are pleased to announce a new LabVIEW interface tutorial for both our WinCamD image profilers and BeamMap2 scanning slit profilers. The interface tutorial includes new LabVIEW interface examples which can easily be modified to suit a great variety of applications.
Beam Profiling for Small Beam Widths or Spot Size
Beam Profiling Concepts |September 14, 2015
Beam width or spot size is an important parameter to identify in selecting the optimal beam profiler. Scanning slit beam profilers are ideal for measuring small Gaussian beams.
Profiling Large Laser Beams: Considerations and Solutions
Beam Profiling Concepts |August 18, 2015
Profiling large laser beams is a common industry need, one with many challenges. What is small to one researcher may be quite large to another...
DataRay OCX: Documentation
DataRay Software |April 13, 2015
We are pleased to announce full documentation of the DataRay OCX. This documentation provides all necessary information about the functions accessible through Component Object Model interfaces across languages.