Focus Measurement
All DataRay's ISO 11146-compliant beam profilers, including Beam Profiling Cameras and Scanning Slit Beam Profilers, can measure a beam focus. Our cameras can directly measure focus spots as small as 32 um in diameter. Our scanning slit beam profilers can directly measure focus spots as small as 2 um in diameter. We also design affordable reimaging and magnification systems to profile inaccessible beam waists, or beam waists outside the limits of a direct measurement.
Direct Measurement
- Camera-based
- For focus spots 32 um or larger in the 190-1350 nm wavelength range
- Provides accurate diameter measurement, 2D image and profiles
- Option to measure spots 170 um or larger in the 2-16 um wavelength range
- Scanning slit-based
- For focus spots 2 um or larger in the 190-2500 nm wavelength range
- Provides accurate diameter measurement and summed X/Y profiles
Measurement with Reimaging or Magnification
- LensPlate2
- For inaccessible beam waists or beam waists outside typical diameter limits
- Calibrated by DataRay to provide accurate magnification factor
Figure 1: LensPlate2 on BeamMap2 measuring the output waist diameter and M2 value from a waveguide
- LensPlate2-PPBS
- For high power focus measurements that require reimaging or magnification
- Reimaging system with integrated high-power beam sampler
- Calibrated by DataRay to provide accurate magnification factor
Figure 2: This LensPlate2-PPBS was designed for a customer's unique application
If you are unsure as to which is most suitable for your application, please contact us or filter by your application criteria.
