Characterizing tightly focused, high-power lasers, like those found in laser welding, etching, additive manufacturing, and other advanced processes, can be challenging for many beam profiling systems. For camera-based profilers, the measurement accuracy of small-diameter beams is limited by the pixel pitch of the sensor array. While scanning slit profilers can overcome this limitation, they are restricted to summed 1D measurements and cannot generate true 2D beam images. Additionally, both approaches often require significant attenuation when measuring high-power beams to prevent damage to sensitive profiler components.
DataRay’s Industrial Laser Monitoring System (ILMS) addresses both of these challenges. By incorporating magnification optics, tightly focused beams can be magnified onto a camera sensor, enabling accurate, full 2D beam profiles of small-diameter focused beams. The integrated dual-wedged beam sampler preserves beam polarization while protecting the sensitive camera sensor, and neutral density (ND) filters provide precise attenuation control. The video below demonstrates how the ILMS works.
Available in configurations covering wavelengths from 190 nm to 16 µm, the ILMS is an ideal solution for profiling tightly focused, high-power laser beams. Not sure which configuration is right for your application? Our team of beam profiling experts is happy to help. Contact us today!
