Come see us at SPIE Optics + Photonics 2019!

Come visit DataRay Inc. at SPIE Optics + Photonics at booth 102.

Product demonstrations

Our newest beam profiler, the TaperCamD-LCM large area CMOS beam profiler, will be on display. This unique profiler combines the proven WinCamD-LCM CMOS beam profiler system with a huge 25 x 25 mm active area to profile even very large beams. Stop by and see this system on display at the show.

Additionally, our M2DU translation stages will be demonstrated – available in both 50 and 200 mm lengths, these stages feature fully automated control through DataRay's intuitive, user-friendly software, allowing incredibly simple, streamlined M² and divergence measurements.

Stop by our booth and chat!

Our team of beam profiling experts has years of experience in the industry, and would be happy to discuss the various aspects of your unique application, whether M² measurements, beam diameter measurements, or other laser beam profiling questions with you. Drop by our booth to learn how we can support your application!