DataRay Inc. Awarded ISO 9001:2015 Certification
Redding, CA USA, April 8, 2019 – DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce it has achieved ISO 9001:2015 certification.
Redding, CA USA, April 8, 2019 – DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce it has achieved ISO 9001:2015 certification.
Redding, CA USA, January 28, 2019 – DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of the new TaperCamD-LCM large area CMOS beam profiler...
Redding, CA USA, August 4, 2017 – DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, broadband 2 to 16 µm MWIR/FIR beam profiler system...
Redding, CA USA, April 1, 2016 – DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, NIR-Enhanced version of the popular WinCamD-LCM CMOS beam profiler...