DataRay Blog

July 01, 2014

White Paper: Simultaneous Intensity Profiling BladeCam-XHR Camera

As Industrial Affiliates of the University of Arizona College of Optical Sciences, we are pleased to announce the availability of a new white paper featuring the BladeCam-XHR CMOS beam profiling camera.

The white paper, Simultaneous Intensity Profiling BladeCam-XHR Camera, describes how DataRay Inc.’s compact BladeCam-XHR CMOS beam profiling camera was used by the University to simultaneously measure the intensity profile measurements for multiple beams by measuring the diffraction pattern from a diffraction grating and the intensity profile from a 3x3 fiber array focused using a 0.5 NA objective.

You can download a copy of the white paper here.

Posted by: Kevin Garvey