April 01, 2016

DataRay Inc. Announces WinCamD-LCM-NE NIR-Enhanced CMOS Beam Profiler

Redding, CA USA, April 1, 2016 – DataRay Inc., the worldwide leader in laser beam profiling and analysis, is pleased to announce the availability of a new, NIR-Enhanced version of the popular WinCamD-LCM CMOS beam profiler. Key comparisons between the new WinCamD-LCM-NE and the standard WinCamD-LCM include:

  • Enhanced NIR sensitivity – above ~600 nm, the WinCamD-LCM-NE features enhanced spectral response compared to the WinCamD-LCM, including a measured three times higher responsivity at 1310 nm
  • Measured SNR and long exposure dark noise are unchanged
  • Microlenses – due to the presence of microlenses, operation below 355 nm is not supported with the WinCamD-LCM-NE

With an update rate of up to 60 Hz, 5.5 µm pixels, 2048 x 2048 active area, a global shutter with an optical/TTL trigger, it is uniquely suited to pulsed lasers—a CMOS detector means no comet tailing, and the global shutter and trigger enable pulse capture, unlike previous generation CMOS cameras.

The WinCamD-LCM-NE is paired with DataRay’s full-featured, highly customizable, user-centric software (which has no license fees, unlimited installations, and free software updates). It is perfect for applications including: CW and pulsed laser profiling; field servicing of laser systems; optical assembly; instrument alignment; beam wander and logging; R&D; OEM integration; quality control; and M² measurement with available M2DU stage.

About DataRay Inc.:

Founded in 1988, DataRay Inc. is the worldwide leader in laser beam profiling and analysis, delivering high-quality, affordable, and reliable instrumentation to the photonics industry. Product lines include beam profiling cameras (190 nm to 14 µm, model-dependent), and scanning slit beam profilers (190 nm to 4 µm, model-dependent). For more information, visit www.dataray.com or email sales@dataray.com.