UV and X-ray Beam Profiling
DataRay offers multiple ISO 11146-compliant solutions for profiling UV and X-ray beams, including UV-sensitive Scanning Slit Beam Profilers and Beam Profiling Cameras, and add-on UV converters for cameras.
- X-ray to 400 nm – for beam imaging, the generally-preferred approach is a UV converter attached to a Beam Profiling Cameras, handling beam diameters from 100 μm up to around 30 mm. These screw-on assemblies offer high damage thresholds, excellent linearity, and lengthy lifetimes
- ≥ 190 nm (no imaging required) – for small CW beams below 4 mm, Scanning Slit Beam Profilers with response down to 190 nm are ideal
- ≥ 190 nm (imaging required) – Specific Beam Profiling Camera systems are available in UV capable configurations suitable for operation down to 190 nm. The WinCamD-LCM-UV's CMOS sensor is uniquely equipped to remain stable as low as 266 nm. Our other UV-capable cameras are stable at 355 nm, but at 266 nm and lower, the silicon detector may eventually degrade leading to higher dark current and lower sensitivity. Replacement detectors are available through the RMA process.
If you are unsure as to which is most suitable for your application, please contact us or filter by your application criteria.