Divergence Measurement

DataRay offers a full range of ISO 11146-compliant beam profilers, both camera- and scanning slit-based which provide multiple methods of measuring beam divergence.

Beam divergence is defined in the far-field where the beam divergence is constant. For highly diverging beams the divergence measurement can be made directly in the far-field, but for lower divergence or collimated beams the beam waist and far-field may be inaccessible or difficult to define.

When measuring far-field divergence from the:

Also refer to M² Measurement & Analysis, as this requires the simultaneous measurement of divergence and beam waist diameter.

If you are unsure as to which is most suitable for your application, please contact us or filter by your application criteria.