BeamScope-P8 – Scanning Slit Beam Profiler System

USB 2.0
Product ID: S-BSC-P8

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Probing Head XY Scanning Slit, 190 – 3500* nm USB 2.0 Features 190 to 1150 nm, Silicon detector Beam dimensions ~100 µm to 45 mm ISO 11146 compliant Narrow probe for confined spaces Front-mounted slits/apertures Wide dynamic range M² option – beam propagation analysis, divergence, focus 2D scan option – 45 x 23 mm scanned area image Applications Laser & laser diode characterization Laser assembly development, alignment, characterization, production test & QA MIR Laser Profiling* M² measurement with available M2DU stage Lasers & laser assemblies for: Disk & wafer characterization Laser printing & marking Medical lasers Bar code scanners * model-dependent