High Resolution Focus Imaging – High Damage Threshold (Up to 1* kW)
The ILMS is specially designed for profiling focused, high-power industrial lasers. This system combines reimaging/magnification optics, a polarization preserving beam sampler, and a DataRay beam profiler to measure small beam waists which would otherwise damage a traditional profiling system. Magnification of the focused beam allows full pixel-by-pixel 2D measurements of beam spots as small as a few microns.
The ILMS is compatible with most DataRay profilers and supported by the full-featured, highly customizable, and user-centric software (included without licensing fees). The software automatically accounts for the magnification of the system, so results do not require post processing or corrections.
Features
- Options from 190nm up to 16 μm
- Beam waist diameters down to a few μm
- High magnification options available (50X and beyond)
- Capable of measuring high power beams, up to kW range possible
- Three swappable filters for flexible attenuation
- Profiler easily removed from system for stand-alone use
- Optional calibrated pinhole aperture denotes working distance and helps provide protection against damage from beam misalignment
- Available without beam sampler for focused, low power beams
- Integrated power meter options (contact us for more information)
Applications
- Tightly focused beams, fiber ends, edge couplers, laser diodes, and more
- High power laser cutting systems
- Telecommunications
- Quality control
* Supported beam diameter and power limits are model-dependent. Please contact us to discuss options for custom requirements.
Please note:
This product requires 64-bit Windows 7, 8/8.1, 10, or 11
| Specification | Detail |
|---|---|
| Magnification | ILMS-5-X: 5x ILMS-10-X: 10x ILMS-50-X-: 50x |
| AR Coating Wavelength (nm) | ILMS-X-UV: 250-425 ILMS-X-VIS: 425-675 ILMS-X-532: 532 ILMS-X-NIR: 750-1550 ILMS-X-1064: 1064 |
| Input Optics NA | ILMS-5-X: 0.17 ILMS-10-X: 0.17 ILMS-50-532-: 0.6 ILMS-50-1064: 0.65 |
| System Dimensions (mm) | ILMS-5-X: 70.00 x 133.25 x 176.30 ILMS-10-X: 70.00 x 133.25 x 252.50 ILMS-50-X: 70.00 x 133.25 x 328.70 |
| Typical minimum beam waist diameter (1/e², um) | ILMS-5-X: 11 ILMS-10-UV: 5.5 ILMS-10-VIS: 5.5 ILMS-10-NIR: 9 ILMS-50-532: 2 ILMS-50-1064: 3 |
| Integrated Beam Profiling Camera | ILMS-X-UV: WinCamD-LCM ILMS-X-VIS: WinCamD-LCM ILMS-X-532: WinCamD-LCM ILMS-X-NIR: WinCamD-LCM ILMS-X-1064: WinCamD-LCM |
| Pixel Count, H x V | WinCamD-LCM: 4.2 MPixel, 2048 x 2048 |
| Optical Format | WinCamD-LCM: 1" |
| Image Area | WinCamD-LCM: 11.3 x 11.3 mm |
| Pixel Dimension | WinCamD-LCM: 5.5 x 5.5 µm |
| Shutter Type | WinCamD-LCM: Global |
| Max. Frame Rate* | WincamD-LCM: 60 Hz |
| Single Pulse Capture PRR | WinCamD-LCM: USB 2.0 @ 6.3 kHz; USB 3.0 @ 12.6 kHz |
| Signal to RMS Noise | WinCamD-LCM: 2,500:1 (34 dB optical / 68 dB electrical) |
| Electronic Shutter Range | WinCamD-LCM: USB 2.0 @ 12,600:1 (41 dB), USB 3.0 @ 25,000:1 (44 dB) |
| ADC | WinCamD-LCM: 12-bit |
| Measurable Sources | WinCamD-LCM: CW beams, pulsed sources; CW to 12.6 kHz with single pulse isolation |
| Measured Beam Powers | Model dependent, contact sales@dataray.com |
| Manual Beam Attenuation | Includes ND-1, ND-2, and ND-4 filter inserts |
| Displayed Profiles | Line, 2D & 3D plots. Normalized or un-normalized. Linear or Logarithmic, Zoom x10 2D, 3D in 10, 32 or max. colors or grayscale Contoured display at 10 and 32 colors |
| Measured & Displayed Profile Parameters | Raw and smoothed profiles Triangular running average filter up to 10% FWHM |
| Beam Diameter | Diameter at two user set Clip levels Gaussian & ISO 11146 Second Moment beam diameters Equivalent diameter above a user defined Clip level Equivalent Slit and Knife Edge diameters |
| Beam Fits | Gaussian & Top Hat profile fit & % fit Equivalent Slit profile |
| Beam Ellipticity | Major, Minor & Mean diameters. Auto-orientation of axes. |
| Centroid Position | Relative and absolute Intensity Weighted Centroid and Geometric Center Beam Wander Display and Statistics |
| Measurement Accuracy (not limited to pixel size) | 0.1/M µm processing resolution for interpolated diameters (where M is magnification) Absolute accuracy is beam profile dependent - ~1/M µm accuracy is frequently achievable (where M is magnification) Centroid accuracy is also beam dependent (as good as ±1/M µ since it is arithmetically determined from all pixels above the centroid clip level) (where M is magnification). |
| Processing Options | Image & profile Averaging, 1, 5, 10, 20, Continuous. Background Capture and Subtraction. User set rectangular Capture Block for capture User set or Auto ellipse Inclusion region with beam tracking for processing *.ojf files save all WinCamD custom settings for particular test configurations |
| Pass/Fail display | On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
| Log Data and Statistics | Min., Max., Mean, Standard Deviation, to 4096 samples |
| Relative Power Measurement | Rolling histogram based on user's initial input. Units of mW, µJ, dBm, % or user choice (relative to a reference measurement input) |
| Fluence | Fluence, within user defined area |
| Certification | RoHS, WEEE, CE |
| Multiple Cameras | Up to 4 cameras, parallel capture. 1 to 8 cameras, serial capture. |
| Optical depth from housing/filter to sensor (no window) ±0.2 mm | 4.0/ 8.5 mm (verify before purchasing) |
| Mounting | M6 and M3 mounting points |
| Weight‚ Camera w/ MagND and filter cover | 5 lbs (2kgs) |
| Minimum PC Requirements | Windows 7/8/8.1/10/11 64-bit, 4 GB RAM, USB 2.0/3.0 port |
* Capture block size dependent
Product specifications are subject to change without notice
Coming soon
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eDrawings EASM | STEP 3D Model | Adobe PDF |