Multiple Z-plane XYZΘΦ Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0
Features
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Multiple plane spacing options available – please review this worksheet to identify the correct plane spacing for your application
- Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode*
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 µm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Real-time multiple Z plane scanning slit system
- Real-time XYZ profiles, Focus position
- Real-time M², Divergence, Collimation, Alignment
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
- M² measurement with available M2DU stage
* model-dependent
| Specification | Detail |
|---|---|
| Wavelength | Si detector: 190 to 1150 nm InGaAs detector: 650 to 1800 nm Si + InGaAs detectors: 190 to 1800 nm Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm |
| Scanned Beam Diameters | Si detector: 5 µm to 4 mm, to 2 µm in Knife-Edge mode* InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode* InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode* |
| Plane Spacing (4XY models) | 100 µm: -100, 0, +100, +400 µm 250 µm: -250, 0, +250, +1000 µm 500 µm: -500, 0, +500, +2000 µm 750 µm: -750, 0, +750, +3000 µm |
| Plane Spacing (3XYKE models) | 50 µm: -50, 0, +50, 0 µm 100 µm: -100, 0, +100, 0 µm |
| Beam Waist Diameter Measurement | Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat 1/e² (13.5%) width User selectable % of peak Knife-Edge mode* for very small beams |
| Beam Waist Position Measurement | ± 20 µm best in X, Y, and Z — contact DataRay for recommendation |
| Measured Sources | CW; Pulsed lasers, F µm = [500/(PRR in kHz)] |
| Resolution Accuracy | 0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm |
| M² Measurement | 1 to > 20, ± 5% |
| Divergence/Collimation, Pointing | 1 mrad best — contact DataRay for recommendation |
| Maximum Power & Irradiance | 1 W Total & 0.5 mW/µm² |
| Gain Range | 1,000:1 Switched 4,096:1 ADC range |
| Displayed Graphics | X-Y-Z Position & Profiles, Zoom x1 to x16 |
| Update Rate | ~5 Hz |
| Pass/Fail Display | On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
| Averaging | User selectable running average (1 to 8 samples) |
| Statistics | Min., Max., Mean, Standard Deviation Log data over extended periods |
| XY Profile & Centroid | Beam Wander display and logging |
| Minimum PC Requirements | Windows, 2 GB RAM, USB 2.0/3.0 port |
* Knife-Edge mode requires 3XYKE model
Product specifications are subject to change without notice
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eDrawings EASM | STEP 3D Model | Adobe PDF |